Temperature sensitivity of void nucleation and growth parameters for single crystal copper: a molecular dynamics study

Author: Rawat S   Warrier M   Chaturvedi S   Chavan V M  

Publisher: IOP Publishing

ISSN: 0965-0393

Source: Modelling and Simulation in Materials Science and Engineering, Vol.19, Iss.2, 2011-03, pp. : 25007-25026

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Abstract