New Concepts for X-Ray, Soft X-Ray, and EUV Optical Instrumentation Including Applications in Spectroscopy, Plasma Diagnostics, and Biomedical Microscopy: A Status Report

Author： Kantsyrev V.L.   Bruch R.   Phaneuf R.   Publicover N.G.  

Publisher： Ios Press

E-ISSN： 1095-9114|7|2|139-158

ISSN： 0895-3996

Source： Journal of X-Ray Science and Technology, Vol.7, Iss.2, 1997-06, pp. : 139-158

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