Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot Plasmas

Author: Fraenkel B.S.   Bitter M.   Goeler S.   Hill K.  

Publisher: Ios Press

E-ISSN: 1095-9114|7|2|171-185

ISSN: 0895-3996

Source: Journal of X-Ray Science and Technology, Vol.7, Iss.2, 1997-06, pp. : 171-185

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