Structural Characterization of Microscopic Defects in (111) AgBrI Microcrystals: Correlation of Stacking Fault Defects to Twin Boundary Morphology

Author: Chen Samuel   Taddei A. E.   Jagannathan S.   Antoniades M. G.  

Publisher: Society for Imaging Science and Technology

ISSN: 1943-3522

Source: Journal of Imaging Science and Technology, Vol.45, Iss.3, 2001-05, pp. : 230-233

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content