Image Analysis Applied to Film Thickness Measurements with White Light Interferometry

Author： Marklund Olov Gustafsson Lennart

Publisher： Society for Imaging Science and Technology

ISSN： 2166-9635

Source： Color and Imaging Conference, Vol.1994, Iss.1, 1994-01, pp. : 186-189

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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