Author: Lima M. de J.V. Ellis R.H.
Publisher: International Seed Testing Association
ISSN: 1819-5717
Source: Seed Science and Technology, Vol.33, Iss.1, 2005-04, pp. : 157-166
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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