Author: Bhanuprakash K. Yogeesha H.S. Vasugi C. Arun M.N. Naik L.B.
Publisher: International Seed Testing Association
ISSN: 1819-5717
Source: Seed Science and Technology, Vol.36, Iss.3, 2008-10, pp. : 792-794
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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