The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

Author： Zablotskii A.   Kuzin A.   Mikheev N.   Stepovich M.   Todua P.   Shirokova E.   Filippov M.  

Publisher： Springer Publishing Company

ISSN： 0543-1972

Source： Measurement Techniques, Vol.56, Iss.7, 2013-10, pp. : 817-822

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