A measuring System for the Spectroscopy of the Low-Frequency Noise of Semiconductor Diode Structures

Author： Kostryukov S.   Ermachikhin A.   Litvinov V.   Kholomina T.   Rybin N.  

Publisher： Springer Publishing Company

ISSN： 0543-1972

Source： Measurement Techniques, Vol.56, Iss.9, 2013-12, pp. : 1066-1071

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