![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Houk L.L. Johnson S.K. Feng J. Houk R.S. Johnson D.C.
Publisher: Springer Publishing Company
ISSN: 0021-891X
Source: Journal of Applied Electrochemistry, Vol.28, Iss.11, 1998-11, pp. : 1167-1177
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Doubova L.
Russian Journal of Electrochemistry, Vol. 46, Iss. 11, 2010-11 ,pp. :
![](/images/ico/o.png)
![](/images/ico/ico5.png)
By Motoc Sorina Manea Florica Iacob Adriana Martinez-Joaristi Alberto Gascon Jorge Pop Aniela Schoonman Joop
Sensors, Vol. 16, Iss. 10, 2016-10 ,pp. :