Author: Chauvaut V. Albin V. Schneider H. Cassir M. Ardéléan H. Galtayries A.
Publisher: Springer Publishing Company
ISSN: 0021-891X
Source: Journal of Applied Electrochemistry, Vol.30, Iss.12, 2000-12, pp. : 1405-1413
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Cassir M. Chauvaut V. Alfarra A. Albin V.
Journal of Applied Electrochemistry, Vol. 30, Iss. 12, 2000-12 ,pp. :
By Chauvaut V. Cassir M. Denos Y.
Electrochimica Acta, Vol. 43, Iss. 14, 1998-05 ,pp. :
By Petrushina I.M. Qingfeng L. Borup F. Bjerrum N.J.
Journal of Applied Electrochemistry, Vol. 30, Iss. 8, 2000-08 ,pp. :
In-situ Raman spectroscopic studies on the oxide species in molten Li/K 2 CO 3
By Chen L.-J. Cheng X. Lin C.-J. Huang C.-M.
Electrochimica Acta, Vol. 47, Iss. 9, 2002-02 ,pp. :