Effects of Quasiparticle Recombination and Photoelectron Escape in Al-Superconducting Tunnel Junction Detectors

Author： Angloher G.   Huber M.   Jochum J.   von Feilitzsch F.   Mößbauer R.L.   Sáfrán G.  

Publisher： Springer Publishing Company

ISSN： 0022-2291

Source： Journal of Low Temperature Physics, Vol.123, Iss.3-4, 2001-05, pp. : 165-180

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