Extended X-ray absorption fine structure (EXAFS) study of secondary phases in Yb2O3-doped Si3N4 ceramics

Author: Kizler P.   Kleebe H.J.   Aldinger F.   Ruhle M.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.32, Iss.2, 1997-02, pp. : 369-374

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Abstract