Interactions of thin films of Pd and Pd/Si on GaAs: an X-ray photoelectron spectroscopic study combined with a thermodynamic analysis

Author: Iwakuro H.   Kuroda T.   Shen D.H.   Yagi H.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.33, Iss.2, 1998-02, pp. : 379-384

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