High-temperature slow crack growth of silicon carbide determined by constant-stress-rate and constant-stress testing

Author: CHOI SUNG R   SALEM J. A   NEMETH N. N  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.33, Iss.5, 1998-03, pp. : 1325-1332

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Abstract