Defect-induced microstructures: an X-ray diffraction analysis

Author: Chrosch J.   Colombo M.   Memmi I.   Biagini R.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.34, Iss.10, 1999-05, pp. : 2263-2267

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Abstract