Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy

Author: Shi B.X.   Ong C.W.   Tam K.L.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.34, Iss.21, 1999-11, pp. : 5169-5173

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