Atomic force microscopy study of the tetragonal to monoclinic transformation behavior of silica doped yttria-stabilized zirconia

By Deville Sylvain   Chevalier Jérôme   Gremillard Laurent  

Journal of Materials Science, Vol. 40, Iss. 14, 2005-07 ,pp. : 3821-3823

Springer Publishing Company

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Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers

By Ma J.   Cui F.   Liu B.   Xu Q.  

Journal of Materials Science: Materials in Medicine, Vol. 18, Iss. 5, 2007-05 ,pp. : 851-856

Springer Publishing Company

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Atomic force microscopy (AFM) characterisation of the porous silica nanostructure of two centric diatoms

By Losic Dusan   Pillar Rachel   Dilger Thorsten   Mitchell James   Voelcker Nicolas  

Journal of Porous Materials, Vol. 14, Iss. 1, 2007-03 ,pp. : 61-69

Springer Publishing Company

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Morphology study of rubber based nanocomposites by transmission electron microscopy and atomic force microscopy

By Sadhu S.   Bhowmick A.  

Journal of Materials Science, Vol. 40, Iss. 7, 2005-04 ,pp. : 1633-1642

Springer Publishing Company

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Study of electropolymerised polyaniline films using cyclic voltammetry, atomic force microscopy and optical spectroscopy

By Sharma Madhulika   Kaushik Diksha   Singh Ragini   Pandey R.  

Journal of Materials Science: Materials in Electronics, Vol. 17, Iss. 7, 2006-07 ,pp. : 537-541

Springer Publishing Company

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