Microstructural characterization of γ-TiAl base alloy by electron probe x-ray microanalysis and electron backscatter diffraction

Author： Levin L. Tokar A. Berner A.

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.35, Iss.15, 2000-08, pp. : 3923-3929

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