XRD, TEM, IR and 29Si MAS NMR characterization of NiO-SiO2 nanocomposites

Author: Casu M.   Lai A.   Musinu A.   Piccaluga G.   Solinas S.   Bruni S.   Cariati F.   Beretta E.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.36, Iss.15, 2001-08, pp. : 3731-3735

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