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Springer Publishing Company

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Micro-Raman spectroscopy and X-ray diffraction studies of atomic-layer-deposited ZrO₂ and HfO₂ thin films

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Crystal structure refinement of the semiconducting compound Cu 2 SnSe 3 from X-ray powder diffraction data

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X-ray photoelectron spectrum, X-ray diffraction data, and electronic structure of chalcogenide quaternary sulfide Ag 2 In 2 GeS 6 : experiment and theory

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