X-ray absorption spectroscopy, simulation and modeling of Si-DLC films

Author: Palshin V.   Tittsworth R.C.   Fountzoulas C.G.   Meletis E.I.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.37, Iss.8, 2002-04, pp. : 1535-1539

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