Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

Author: Zhao L.   Kop T.A.   Rolin V.   Sietsma J.   Mertens A.   Jacques P.J.   van der Zwaag S.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.37, Iss.8, 2002-04, pp. : 1585-1591

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