Application of Raman microscopy to the analysis of silicon carbide monofilaments: SPECIAL SECTION: Characterisation of Ceramics (Guest Editor: M. H. Lewis)

Author： Ward Y.   Young R. J.   Shatwell R. A.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.39, Iss.22, 2004-11, pp. : 6781-6790

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