Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

Author： Ryu Y. S.   Song B. S.   Kang T. W.   Kim T. W.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.39, Iss.3, 2004-02, pp. : 1147-1149

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