Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data

Author: Kim Yong-Il   Im Won   Jeon Duk  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.41, Iss.5, 2006-03, pp. : 1643-1647

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Abstract