The Relationship of the Degree of Exposure to a Technological Disaster and Emotional Response: A Structural Model Approach

Author： Esparcia A.J.   Guárdia Olmos J.  

Publisher： Springer Publishing Company

ISSN： 0033-5177

Source： Quality and Quantity, Vol.35, Iss.2, 2001-05, pp. : 161-171

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