Author: Ma Hwa-Chun Chen Yen-Wen
Publisher: Springer Publishing Company
ISSN: 0033-5177
Source: Quality and Quantity, Vol.43, Iss.4, 2009-07, pp. : 645-652
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Quality and Quantity, Vol. 40, Iss. 4, 2006-08 ,pp. :
Probabilistic pattern of risks in company’s Quality management system
SHS Web of Conferences, Vol. 35, Iss. issue, 2017-06 ,pp. :