An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

Author： Lee Yong-Gil   Lee Jeong-Dong   Song Yong-Il   Lee Se-Jun  

Publisher： Springer Publishing Company

ISSN： 0138-9130

Source： Scientometrics, Vol.70, Iss.1, 2007-01, pp. : 27-39

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