Photothermal Depth Profiling by Thermal Wave Backscattering and Genetic Algorithms

Author： Voti R.   Sibilia C.   Bertolotti M.  

Publisher： Springer Publishing Company

ISSN： 0195-928X

Source： International Journal of Thermophysics, Vol.26, Iss.6, 2005-11, pp. : 1833-1848

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