A New Spectrophotometer System for Measuring Hemispherical Reflectance and Normal Emittance of Real Surfaces Simultaneously

Author： Makino Toshiro   Wakabayashi Hidenobu  

Publisher： Springer Publishing Company

ISSN： 0195-928X

Source： International Journal of Thermophysics, Vol.31, Iss.11-12, 2010-12, pp. : 2283-2294

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