The use of Ols charge referencing for the X-ray photoelectron spectroscopy of Al/Si, AI/Ti and Al/Zr mixed oxides

Author： Bhattacharya A. K.   Pyke D. R.   Reynolds R.   Walker G. S.   Werrett C. R.  

Publisher： Springer Publishing Company

ISSN： 0261-8028

Source： Journal of Materials Science Letters, Vol.16, Iss.1, 1997-01, pp. : 1-3

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