Atom trap trace analysis

Author: Bailey K.   Chen C.Y.   Du X.   Li Y.M.   Lu Z. T.   O'Connor T.P.   Young L.  

Publisher: Springer Publishing Company

ISSN: 0304-3843

Source: Hyperfine Interactions, Vol.127, Iss.1-4, 2000-08, pp. : 515-518

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Abstract