XPS analysis and luminescence properties of thin films deposited by the pulsed laser deposition technique

Author： Dolo J.   Swart H.   Coetsee E.   Terblans J.   Ntwaeaborwa O.   Dejene B.  

Publisher： Springer Publishing Company

ISSN： 0304-3843

Source： Hyperfine Interactions, Vol.197, Iss.1-3, 2010-04, pp. : 129-134

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