Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis

Author: Czutro Alexander   Polian Ilia   Lewis Matthew   Engelke Piet   Reddy Sudhakar   Becker Bernd  

Publisher: Springer Publishing Company

ISSN: 0885-7458

Source: International Journal of Parallel Programming, Vol.38, Iss.3-4, 2010-06, pp. : 185-202

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Abstract