Full Time-Varying Phase Noise Analysis for MOS Oscillators Based on Floquet and Sylvester Theorems

Author： Fan Jianxing   Yang Huazhong   Wang Hui  

Publisher： Springer Publishing Company

ISSN： 0925-1030

Source： Analog Integrated Circuits and Signal Processing, Vol.45, Iss.3, 2005-12, pp. : 247-261

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