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By Li Junhong   Wang Chenghao   Liu Mengwei   Ma Jun  

Ferroelectrics, Vol. 445, Iss. 1, 2013-01 ,pp. : 32-38

Taylor & Francis Ltd

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Effect of SrTiO3 Buffer Layers on Crystallization and Properties of Sol-Gel Derived Pb(Zr0.52Ti0.48)O3 Thin Films

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Residual stress of (Pb 0.92 La 0.08 )(Zr 0.52 Ti 0.48 )O 3 films grown by a sol-gel process

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Use of thermogravimetric analysis-Fourier transform infrared spectroscopy in the study of the reaction mechanism of the preparation of Pb(Zr, Ti)O 3 by the sol-gel method

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Low Temperature Preparation of Pb(Zr 0.52 Ti 0.48 )O 3 Thin Films Using Pulsed Excimer Laser Annealing Process

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