Analysis of Accumulation Patterns of Barley yellow dwarf virus-PAV (BYDV-PAV) in Two Resistant Wheat Lines

Author: Chain Florian   Riault Gérard   Trottet Maxime   Jacquot Emmanuel  

Publisher: Springer Publishing Company

ISSN: 0929-1873

Source: European Journal of Plant Pathology, Vol.113, Iss.4, 2005-12, pp. : 343-355

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