Obtaining Shape from Scanning Electron Microscope using Hopfield Neural Network

Author: Iwahori Yuji   Kawanaka Haruki   Fukui Shinji   Funahashi Kenji  

Publisher: Springer Publishing Company

ISSN: 0956-5515

Source: Journal of Intelligent Manufacturing, Vol.16, Iss.6, 2005-12, pp. : 715-725

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Abstract