Preparation and characterization of polycrystalline CdZnTe films for large-area, high-sensitivity X-ray detectors

Author： Tokuda S.   Kishihara H.   Adachi S.   Sato T.  

Publisher： Springer Publishing Company

ISSN： 0957-4522

Source： Journal of Materials Science: Materials in Electronics, Vol.15, Iss.1, 2004-01, pp. : 1-8

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