Evaluation of residual stress in BaTiO3-based Ni-MLCCs with X7R characteristics

Author: Park Dong-Ho   Jung Yeon-Gil   Paik Ungyu  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.15, Iss.4, 2004-04, pp. : 253-259

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