Lifetime and leakage current considerations in metal-doped germanium

Author: Simoen E.   Claeys C.   Sioncke S.   Steenbergen J.   Meuris M.   Forment S.   Vanhellemont J.   Clauws P.   Theuwis A.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.18, Iss.7, 2007-07, pp. : 799-804

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Abstract