Role of substrate temperature on the structural, optoelectronic and morphological properties of (400) oriented indium tin oxide thin films deposited using RF sputtering technique

Author: Malathy V.   Sivaranjani S.   Vidhya V.   Balasubramanian T.   Prince J.   Sanjeeviraja C.   Jayachandran M.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.21, Iss.12, 2010-12, pp. : 1299-1307

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