Author: Sheen Jyh Li Chueh-Yu Ji Liang-Wen Mao Wei-Lung Liu Weihsing Chen Chin-An
Publisher: Springer Publishing Company
ISSN: 0957-4522
Source: Journal of Materials Science: Materials in Electronics, Vol.21, Iss.8, 2010-08, pp. : 817-821
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract