Measurements of dielectric properties of TiO2 thin films at microwave frequencies using an extended cavity perturbation technique

Author: Sheen Jyh   Li Chueh-Yu   Ji Liang-Wen   Mao Wei-Lung   Liu Weihsing   Chen Chin-An  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.21, Iss.8, 2010-08, pp. : 817-821

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Abstract