ICTM: An Interval Tessellation-Based Model for Reliable Topographic Segmentation: SCAN'2002 International Conference (Guest Editors: René Alt and Jean-Luc Lamotte)

Author: de Aguiar Marilton Sanchotene   Dimuro Graçaliz Pereira   Costa Antônio Carlos da Rocha  

Publisher: Springer Publishing Company

ISSN: 1017-1398

Source: Numerical Algorithms, Vol.37, Iss.1-4, 2004-12, pp. : 3-11

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