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Society for Applied Spectroscopy

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Depth Profile of Pyrene Dopant in Polymer Films by Variable-Angle Total Internal Reflection Fluorescence Spectroscopy

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Total Internal Reflection Raman Spectroscopy at the Critical Angle for Raman Measurements of Thin Films

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Comparison of synchrotron radiation total reflection X-ray fluorescence excitation-detection geometries for samples with differing matrices

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High-Pressure Total Internal Reflection Fluorescence Apparatus

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