Application of Tight-Binding and Path Probability Methods to the Junction Relaxation of Semiconductor Heterostructures

Author: Masuda-Jindo K.   Kikuchi R.   Nishitani S.R.  

Publisher: Springer Publishing Company

ISSN: 1054-9714

Source: Journal of Phase Equilibria, Vol.22, Iss.4, 2001-08, pp. : 451-456

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Abstract