The Use of XPS, FTIR, SEM/EDX, Contact Angle, and AFM in the Characterization of Coatings

Author: Walzak M.J.   Davidson R.   Biesinger M.  

Publisher: Springer Publishing Company

ISSN: 1059-9495

Source: Journal of Materials Engineering and Performance, Vol.7, Iss.3, 1998-06, pp. : 317-323

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Abstract