Application of doppler broadening of annihilation radiation technique to evaluate the microhardness variations during isochronal annealing of Al and Al (Mn) alloys

Author： Wahab M.   Arafa W.  

Publisher： Springer Publishing Company

ISSN： 1059-9495

Source： Journal of Materials Engineering and Performance, Vol.9, Iss.3, 2000-06, pp. : 355-358

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Positron Annihilation Lifetime (PAL) Studies of the Variations of Microstructure During Isochronal Annealing of Cu-Zn (60/40) Alloy

By Taha Alia S.   El Kahtany Noora A.  

Journal of Materials Engineering and Performance, Vol. 11, Iss. 3, 2002-06 ,pp. : 332-339

Springer Publishing Company

Access to resources Recommend Favorite

Application of Positron Annihilation Spectroscopy to Study Recovery and Recrystallization of Commercial Pure Al and Al-1wt% Mn Alloys

By El Keriem M. S. Abd   Mohsen M.   Khalil M. H.   El Wahab M. Abd   Taha A. S.  

Journal of Materials Engineering and Performance, Vol. 7, Iss. 5, 1998-10 ,pp. : 673-676

Springer Publishing Company

Access to resources Recommend Favorite

Positron annihilation spectroscopy in the evaluation of microstructure of cast copper and copper-aluminum alloys during isochronal annealing

By Arafa W.   Wahab M.  

Journal of Materials Engineering and Performance, Vol. 14, Iss. 4, 2005-08 ,pp. : 473-479

Springer Publishing Company

Access to resources Recommend Favorite

CDBTools - Evaluate Positron Annihilation Coincidence Doppler Broadening Spectrum

By  

Defect and Diffusion Forum, Vol. 2017, Iss. 373, 2017-04 ,pp. : 71-74

Trans Tech Publications

Access to resources Recommend Favorite

Application of Positron Annihilation Spectroscopy to Study the Recovery of Commercial Pure Al and Al-0.96 wt.% Si Alloys

By Ed S. Moham   Mostafa N.   Gomaa E.   Mohsen M.  

Journal of Materials Engineering and Performance, Vol. 12, Iss. 1, 2003-02 ,pp. : 95-98

Springer Publishing Company

Access to resources Recommend Favorite