Measurement of the Metal-Semiconductor Contact Resistance and Control of the Specific Resistance of Semiconductor Films

Author: Filippov V. V.   Frolov P. V.   Polyakov N. N.  

Publisher: Springer Publishing Company

ISSN: 1064-8887

Source: Russian Physics Journal, Vol.46, Iss.7, 2003-07, pp. : 726-735

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Abstract